BIST Detection/Correction of MEC Arrays
نویسندگان
چکیده
The increasing growth of sub-micron technology has resulted in the difficulty of testing. Design and test engineers have no choice but to accept new responsibilities that had been performed by groups of technicians in the previous year BIST is a design technique that allows a circuit to test itself. In this project, the test performance achieved with the implementation of BIST is proven to be adequate to offset the disincentive of the hardware overhead produced by the additional BIST circuit. The technique can provide shorter test time compared to an externally applied test and allows the use of low-cost test equipment during all stages of production. The new Joint Video Team (JVT) video coding standard has garnered increased attention recently. Generally, motion estimation computing array (MECA) performs up to 50% of computations in the entire video coding system, and is typically considered the computationally most important part of video coding systems. For a commercial chip, a video coding system must introduce design for testability (DFT), especially in an MECA. The objective of DFT is to increase the ease with which a device can be tested to guarantee high system reliability. Among these techniques, BIST has an obvious advantage in that expensive test equipment is not needed and tests are low cost. Moreover, BIST can generate test simulations and analyze test responses without outside support, making tests and diagnoses of digital systems quick and effective. However, as the circuit complexity and density increases, the BIST approach must detect the presence of faults and specify their locations for subsequent repair. The extended techniques of BIST are built-in self-diagnosis and built-in self-repair (BISR). Although BIST and BISR are utilized in many studies, most studies focused on memory testing. Nowadays, the computational complexity of modern video coding systems has increased; thus, efficient self-detection and self-correction techniques are needed to improve reliability. I.INTRODUCTION
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